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Yield Estimation Tool Considering Via Failures
We can estimate the total number of vias in a circuit, which is derived from a gate-level netlist(Verilog, etc) instead of layout. The total number of vias depends on the yield of a circuit. We can estimate the yield considering via failures with this tool.
Contact:
Takumi Uezono (ild@lsi.pi.titech.ac.jp)