Vintage is a comprehensive solution for the assessment of NBTI-induced aging effects in System-on-Chip designs. It consists of a Static Simulation Framework which tracks the aging of power-managed logic circuits and SRAM memory arrays, and provides accurate estimation of the life-time of microprocessor-based designs. Easy to integrate into state-of-the-art tools, VintAge represents the enabling technology for future design flows in which aging is included in the optimization loop at any level of abstraction, from application and system level down to circuit and gate level.